VLSI Definitions | |
| Definitions of the terms that are often used in Chip design world. Please help us to improve the list. You can add VLSI terms and its definitions with out registering in the site. | |
| You can always search for entries. | |
|
Submit Term/definitions/company | |
All | 3 | 8 | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z
| |
| All | |
| There are 257 entries in the glossary. | |
| Pages: «1 2 3 4 5 6 7 8 9 » | |
| Term | Definition |
| DSL | A mechanism for providing high-speed digital communications over a standard phone line e.g. Internet access |
| DSM - Deep Sub-Micron. | A fabrication process that employs dimensions less than 0.5-micron. |
| Echelle Grating | A spectroscopic device that gives higher resolution and dispersion than ordinary gratings in wavelength division multiplexing (WDM) applications. |
| Egress port | An egress port is an outgoing port, that is, a port through which a data packet leaves |
| Electron | An elementary atomic particle that carries the smallest negative electric charge (1.6x10-19 coulombs). Electrons are light in mass, highly mobile, and orbit the nucleus of an atom. |
| Embedded Memory | A memory component implemented within an integrated circuit. |
| Embedded Metallization | The deposition of different metals inside a microfluidic channel making an array of electrodes to transport, identify, and analyze various biological materials/agents/cells in a microfluidic chip. |
| Embedded Processor | A data processor component implemented within an integrated circuit. |
| Embedded Software (ESW) | Programs and subroutines running on an embedded processor or digital signal processor that enable the control of other components within an embedded system. |
| Embedded System | A microsystem product or application that is implemented by a number of subsystems, including microelectronics, sensors, and actuators, integrated within the overall design. |
| Embedded Systems | A system in which the computer is included as an integral part of the system ex: Microcontroller or microprocessor. |
| Etch | The process of removing material from a wafer (such as oxides or other thin films) by chemical, electrolytic or plasma (ion bombardment) means. Examples: nitride etch, oxide |
| Fabrication | A manufacturing line capable of creating one or more device types. |
| Fault | The manifestation of a device defect, detectable externally. Faults are detected by comparing specified device parameters and behavior with actual measured parameters and behavior. |
| Fault simulation | Fault simulation is the simulation of a digital circuit model with particular stimuli and with typical manufacturing faults injected into the model. Fault simulation can be done for IC as well as for PCBs. Fault simulation is necessary in the following situations, a) to identify areas of a circuit that are not functionally tested by the functional test vectors, certain internal nodes may not be toggled during functional testing) To check the quality of test vectors and their ability to detect potential manufacturing defects. |
| FET | An FET is one in which the voltage on one terminal (the gate) creates a field that allows or disallows conduction between the other two terminals (the source and drain). |
| FIFO | First-In First Out is a type of memory that stores data serially, where the first bit read is the first bit that was stored. |
| Fixturing | A facility used in the testing of a packaged integrated circuit or microsystem that involves extending the inputs and outputs to an arrangement of accessible terminals for the application and analysis of test signals. |
| FlipChip | A style of integrated circuit packaging that flips the chip over into another chip so that their functional surfaces are facing, and in close proximity to one another. |
| Foundry | The factory where the devices are manufactured. This is at the wafer level. Same as \"Fab\". |
| FPGA | A family of general-purpose logic devices that can be configured by the end user to perform many, different, complex logic functions. It is often used for prototyping logic hardware. |
| FPZSyLyHNUxdicq | N6ocwk ksoaastbouzu, [url=http://kkzsdgifyuya.com/]kkzsdgifyuya[/url], [link=http://ssbyrdxnclya.com/]ssbyrdxnclya[/link], http://fjqinjlgjaua.com/ |
| Frequency Shift Keying | A method of transmitting digital data by shifting the frequency of a carrier signal to represent binary 1s and 0s. |
| Functional test | A test designed to demonstrate the ability of a device to correctly perform one or more intended functions over some range of input conditions and internal states. |
| GaAs | Gallium Arsenide. An alternative semiconductor to silicon that is electronically faster, but more expensive and difficult to work with! |
| Gate | The semiconductor region in a MOS transistor, located between its source and drain regions and having the opposite doping polarity to them. The gate forms a conducting path from source to drain when exposed to an electrical field of sufficient magnitude. |
| Gate Array | An integrated circuit fabrication technology in which the final metal interconnect layers of an otherwise pre-fabricated chip are patterned in accordance with user-supplied design data. |
| Gate electrode | The electrode of a metal oxide semiconductor field effect transistor, it controls the flow of electrical current between the source and the drain. |
| Gate oxide | The thin layer of dielectric between n- and p-type materials in a CMOS transistor. In many CMOS processes capable of building 1 micron channel-length transistors, this oxide thickness is on the order of one hundred angstroms. |
| Gateway | The connecting link and its associated communications control software and hardware between two networks. |
All | 3 | 8 | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z
| |
| Glossary & Definitions | |