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VLSI Definitions
           Definitions of the terms that are often used in Chip design world. Please help us to improve the list. You can add VLSI terms and its definitions with out registering in the site.

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F
There are 12 entries in the glossary.
Pages: 1
Term Definition
FabricationA manufacturing line capable of creating one or more device types.
 
FaultThe manifestation of a device defect, detectable externally. Faults are detected by comparing specified device parameters and behavior with actual measured parameters and behavior.
 
Fault simulationFault simulation is the simulation of a digital circuit model with particular stimuli and with typical manufacturing faults injected into the model. Fault simulation can be done for IC as well as for PCBs. Fault simulation is necessary in the following situations, a) to identify areas of a circuit that are not functionally tested by the functional test vectors, certain internal nodes may not be toggled during functional testing) To check the quality of test vectors and their ability to detect potential manufacturing defects.
 
FETAn FET is one in which the voltage on one terminal (the gate) creates a field that allows or disallows conduction between the other two terminals (the source and drain).
 
FIFOFirst-In First Out is a type of memory that stores data serially, where the first bit read is the first bit that was stored.
 
FixturingA facility used in the testing of a packaged integrated circuit or microsystem that involves extending the inputs and outputs to an arrangement of accessible terminals for the application and analysis of test signals.
 
FlipChipA style of integrated circuit packaging that flips the chip over into another chip so that their functional surfaces are facing, and in close proximity to one another.
 
FoundryThe factory where the devices are manufactured. This is at the wafer level. Same as \"Fab\".
 
FPGAA family of general-purpose logic devices that can be configured by the end user to perform many, different, complex logic functions. It is often used for prototyping logic hardware.
 
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Frequency Shift KeyingA method of transmitting digital data by shifting the frequency of a carrier signal to represent binary 1s and 0s.
 
Functional testA test designed to demonstrate the ability of a device to correctly perform one or more intended functions over some range of input conditions and internal states.
 


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